Recombination Lifetime Measurements in Silicon
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| Main Author: | |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
America:
American Society For Testing And Meterials,
1998.
|
| Subjects: | |
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|---|---|---|---|
| 008 | 181104b ||||| |||| 00| 0 eng d | ||
| 999 | |c 21135 |d 21135 | ||
| 020 | |a 0803124899 | ||
| 041 | |h eng | ||
| 082 | |a 621.38 |b Gup | ||
| 100 | |a Gupta , C Dinesh | ||
| 245 | |a Recombination Lifetime Measurements in Silicon | ||
| 260 | |a America: |b American Society For Testing And Meterials, |c 1998. | ||
| 300 | |a 392 p. |b ; |c 23.3 cm. | ||
| 650 | 0 | |a Engineering & Allied Operation |9 45846 | |
| 942 | |c REF | ||